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Modify existing X.509 test for also test new copyless API

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The existing test `x509parse_crt()` for X.509 CRT parsing
so far used the generic parsing API `mbedtls_x509_crt_parse()`
capable of parsing both PEM encoded and DER encoded certficates,
but was actually only used with DER encoded input data. Moreover,
as the purpose of the test is the testing of the core DER X.509 parsing
functionality, not the PEM vs. DER dispatch (which is now already tested
in the various `x509_crt_info()` tests), the call can be replaced with a
direct call to `mbedtls_x509_parse_crt_der()`.

This commit does that, and further adds to the test an analogous
call to the new API `mbedtls_x509_parse_crt_der_nocopy()` to test
copyless parsing of X.509 certificates.
This commit is contained in:
Hanno Becker 2019-01-31 09:15:53 +00:00
parent d58b133276
commit 2fa5e73d8d
1 changed files with 15 additions and 1 deletions
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16
tests/suites/test_suite_x509parse.function
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@ -505,8 +505,22 @@ void x509parse_crt( data_t * buf, char * result_str, int result )
mbedtls_x509_crt_init( &crt );
memset( output, 0, 2000 );
TEST_ASSERT( mbedtls_x509_crt_parse_der( &crt, buf->x, buf->len ) == ( result ) );
if( ( result ) == 0 )
{
res = mbedtls_x509_crt_info( (char *) output, 2000, "", &crt );
TEST_ASSERT( mbedtls_x509_crt_parse( &crt, buf->x, buf->len ) == ( result ) );
TEST_ASSERT( res != -1 );
TEST_ASSERT( res != -2 );
TEST_ASSERT( strcmp( (char *) output, result_str ) == 0 );
}
mbedtls_x509_crt_free( &crt );
mbedtls_x509_crt_init( &crt );
memset( output, 0, 2000 );
TEST_ASSERT( mbedtls_x509_crt_parse_der_nocopy( &crt, buf->x, buf->len ) == ( result ) );
if( ( result ) == 0 )
{
res = mbedtls_x509_crt_info( (char *) output, 2000, "", &crt );