mirror of
https://github.com/yuzu-emu/mbedtls.git
synced 2024-12-25 02:15:35 +00:00
Speed up the generation of storage format test cases
Restore the optimization done in HEAD^{/Speed up the generation of storage format test cases} which was lost during refactoring made when adding support for implicit usage flags. There are still more than one call to the C compiler, but the extra calls are only for some key usage test cases. This is an internal refactoring. This commit does not change the output of generate_psa_tests.py Signed-off-by: Gilles Peskine <Gilles.Peskine@arm.com>
This commit is contained in:
parent
ba940cc695
commit
3008c58df9
|
@ -489,7 +489,8 @@ class StorageFormat:
|
|||
# test cases. This allows all required information to be obtained in
|
||||
# one go, which is a significant performance gain as the information
|
||||
# includes numerical values obtained by compiling a C program.
|
||||
for key in self.generate_all_keys():
|
||||
all_keys = list(self.generate_all_keys())
|
||||
for key in all_keys:
|
||||
if key.location_value() != 0:
|
||||
# Skip keys with a non-default location, because they
|
||||
# require a driver and we currently have no mechanism to
|
||||
|
|
Loading…
Reference in a new issue